Automated Optical Inspection

Metrology AOI

Metrology AOI – 850 XHD

MVP’s 850 XHD solution provide the highest accuracy flip-chip Die assembly inspection. MVP’s high performance inspection technology ensures the correct placement of the Die on the substrate, while providing edge, FM and surface inspection. Process yields can be substantially increased using metrology to control the Die alignment processes, flux and paste, prior to reflow, ensuring […]