Automated Optical Inspection

Low Volume and NPI AOI – GEM Compact

MVP’s GEM Series AOI system is a revolutionary tabletop, lightweight inspection solution.

Using the same software as all of MVP platforms the GEM now offers unsurpassed high performance and detection capabilities previously only available with our in-line AOI platforms.

The GEM Compact represents a breakthrough in tabletop inspection by providing the leading comprehensive solutions to complex inspection challenges.

Key Features

  • Fast Programming Generation using new ease-of-use software
  • High Throughput to 5 Sq. Inches per Second.
  • Highest Defect Detection using Tri-Color Technology.
  • Up to 12” x 16” Board Size
  • Lowest False Call Rates
  • 2D Paste Capable
  • Tri-Color Lighting